Categorized under Semiconductor Test Equipment. Our records show it was established in 2016 and incorporated in AZ. Current estimates show this company has an annual revenue of 2250000 and employs a staff of approximately 4.

Lorlin Test Systems® manufactures and distributes discrete semiconductor component test systems that run under an Intel® based Windows 7® and up 64-BIT Operating System with a USB 2.0 tester interface. Through years of dedicated engineering excellence, proven designs, and achievements, Lorlin® is proud to maintain the leading cutting edge technology offered in our products. Lorlin's dynamic and encompassing solutions are tailored to customers specific needs and requirements for virtually any test application. Proven superior analog and digital electronics engineering designs for over 50 years utilizing advanced circuitry and technology is why Lorlin products are so desired by engineers. Our visions of the research and development needed to meet the demands of today were realized years ago. Smooth, flawless and flowing engineering design excellence have yielded success, complete customer satisfaction and overwhelming confidence in Lorlins equipment performance. Our test concepts have been developed in an environment of creative flux and intuition with achievements unsurpassed. Our flexibility and creativity enable us to fulfill your application desires and targeted test and manufacturing goals while staying within your budget. The parametric testing equipment is used to test, evaluate and analyze the electrical characteristics of semiconductor devices in component testing and semiconductor manufacturing applications such as production and final test, wafer probe and wafer mapping, QC & QA test, incoming inspection, engineering evaluation and characterization, high reliability, and high volume testing. Lorlin®'s power semiconductor test systems can test, analyze and evaluate numerous devices and components including bipolar transistors (BJT), field effect transistors (FET), insulated gate bipolar transistors (IGBT), silicon controlled rectifiers (SCR), Triacs, diodes, zeners, bridge rectifiers, and Opto-coupled devices. Lorlin® can configure the test system to suite your particular application with voltages up to 2000 volts and currents up to 500 amps with standard products or higher with customized designs. Lorlin® is well known for FET and IGBT testing capabilities including Lorlin's® ultra low leakage testing in the Pico and Femto amp regions. The semiconductor systems can be configured in any combination for up to five test stations in manual, prober or handler test modes.

C TestVIEWTM IDE has been developed to enhance your test creation methodology and provide more comprehensive test for accurate and consistent test results and delivering reliable outcome reporting. The enhanced test environment eliminates the need to write test code and works specifically on Microcontrollers, ASICs, Mixed-Signal devices. 1. C TestVIEWTM reads "your product datasheet" into our Register Map Format (CRMF) and produces a "device specific" test GUI. 2. Using our test GUI a simple and easy connection is made to your test board. 3. Going beyond the IC industry's Eval-Kit capability, our test GUI easily integrates and connects to all of your stand-alone bench test equipment. With C TestVIEWTM in the middle of your bench test equipment and your test board a POWERFU