C TestVIEWTM IDE has been developed to enhance your test creation methodology and provide more comprehensive test for accurate and consistent test results and delivering reliable outcome reporting. The enhanced test environment eliminates the need to write test code and works specifically on Microcontrollers, ASICs, Mixed-Signal devices. 1. C TestVIEWTM reads "your product datasheet" into our Register Map Format (CRMF) and produces a "device specific" test GUI. 2. Using our test GUI a simple and easy connection is made to your test board. 3. Going beyond the IC industry's Eval-Kit capability, our test GUI easily integrates and connects to all of your stand-alone bench test equipment. With C TestVIEWTM in the middle of your bench test equipment and your test board a POWERFU